The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Apr. 11, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Majid Nayeri, Niskayuna, NY (US);

Michael Lexa, Niskayuna, NY (US);

Byron Knight, Niskayuna, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/14 (2006.01); G01N 21/956 (2006.01); G01N 25/72 (2006.01); F01D 21/00 (2006.01); F01D 5/14 (2006.01); F01D 5/18 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95692 (2013.01); F01D 5/147 (2013.01); F01D 5/189 (2013.01); F01D 21/003 (2013.01); G01M 15/14 (2013.01); G01N 25/72 (2013.01); F05D 2220/32 (2013.01); F05D 2260/201 (2013.01); F05D 2260/83 (2013.01); G01N 2021/8887 (2013.01); G01N 2201/102 (2013.01);
Abstract

An inspection system includes a thermographic sensor configured to capture thermographic data of a component having holes as a fluid is pulsed toward the holes, and one or more processors configured to temporally process the thermographic data to calculate temporal scores for the corresponding holes, spatially process the thermographic data to calculate spatial scores for the corresponding holes, and calculate composite scores associated with the holes based on the temporal scores and based on the spatial scores. The composite scores represent a likelihood that the corresponding holes are open, blocked or partially blocked.


Find Patent Forward Citations

Loading…