The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Mar. 02, 2017
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Hidenao Yamada, Hamamatsu, JP;

Toyohiko Yamauchi, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01N 21/45 (2013.01); G01N 2015/1454 (2013.01); G01N 2015/1497 (2013.01);
Abstract

An observation apparatus observes an observation object moving in a flow path with a fluid, and includes a light source, a splitting unit, a combining unit, a collimator, a cylindrical lens, an objective lens, a collimator, a cylindrical lens, an objective lens, a modulation unit, an imaging unit, an analysis unit, and the like. The imaging unit includes a plurality of pixels arranged in a direction intersecting with a moving direction of an image of the observation object on a light receiving plane on which the image of the observation object moving in the flow path is formed, and receives combined light output from the combining unit to repeatedly output a detection signal indicating a one-dimensional interference image. The analysis unit generates a two-dimensional image of the observation object on the basis of the detection signal.


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