The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Oct. 30, 2013
Tectus Dreamlab Pte Ltd, Singapore, SG;
Marcel Poser, Oberuzwil, CH;
Malcolm Lim, Buffalo Grove, IL (US);
TECTUS DREAMLAB PTE LTD, Singapore, SG;
Abstract
An arrangement () for inspecting an object () comprising a mobile measuring unit () for determining a measured value associated with the object (). The measuring unit () has an interface for interchanging data with further units (-). The arrangement also comprises a base unit () in which data records () can be stored and displayed. A detection mechanism () is provided for detecting a measurement position (), at which the measured value is determined, and/or a measurement time at which the measured value is determined. The measured value determined by the measuring unit () can be transmitted, together with measurement position and/or measurement time, as a data record to the base unit (). The mobile measuring unit () determines measured values for an internal structure and/or an internal state of components (), in particular inaccessible components, of the object () in a non-destructive manner.