The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Apr. 24, 2018
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;

Inventors:

Lixin Zhu, Beijing, CN;

Ke Dai, Beijing, CN;

Chunyang Nie, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/50 (2006.01); G01J 3/02 (2006.01); G01B 21/20 (2006.01); G01B 21/16 (2006.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G01J 3/506 (2013.01); G01B 21/16 (2013.01); G01B 21/20 (2013.01); G01J 3/0202 (2013.01); G06T 7/90 (2017.01);
Abstract

Disclosed are display panel test device and method. The device comprises: a color analyser including a host and a measuring probe, wherein the measuring probe can obtain optical information of a positional point of a light emitting surface of display panel, the positional point being a point to which the measuring probe is aligned on the light emitting surface, and the host can determine optical characteristics of the positional point according to the optical information; and a position determination component, configured to determine a positional identifier of the positional point on the light emitting surface, the positional identifier being capable of indicating a relative position of the positional point on the light emitting surface. Since the position determination component determines the position of the to-be-tested point, it is not necessary to visually place the measuring probe over the to-be-tested point, thereby improving the determination accuracy of the to-be-tested point.


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