The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jan. 10, 2019
Topcon Corporation, Itabashi-ku, Tokyo, JP;
You Sasaki, Tokyo, JP;
Kazunori Sato, Tokyo, JP;
TOPCON CORPORATION, Itabashi-ku, Tokyo, JP;
Abstract
Providing a three-dimensional surveying device and method capable of stably acquiring three-dimensional data with high accuracy. The device includes a mobile body, a measurement target, a collimation distance measuring unit fixed to the mobile body, a scanner unit, and a control computation section. The scanner unit is provided integrally and rotatably with respect to the collimation distance measuring unit. The control computation section is configured to calculate a coordinate value of a measurement center of the collimation distance measuring unit based on a distance measured by the collimation distance measuring unit, a first horizontal and first vertical angle, and to calculate a coordinate value of a measurement target object based on the coordinate value of the measurement center, an external orientation element of the scanner unit with respect to the collimation distance measuring unit, a distance measured by the scanner unit and a second horizontal and second vertical angle.