The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Nov. 04, 2016
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Lars R. Furenlid, Tucson, AZ (US);
Xin Li, Tucson, AZ (US);
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Abstract
A method for forming an optimized image of a subject includes steps of acquiring a plurality of one-dimensional images, generating a measured sinogram from the plurality of one-dimensional images, and determining a plurality of trial images. In the step of acquiring, the method acquires a plurality of one-dimensional images of the subject captured by a rotating-slit imager having (a) a detector, and (b) a slit collimator having a slit oriented at one of a respective plurality of slit-rotation angles, relative to the subject, about a longitudinal axis substantially perpendicular to a front surface of the detector. In the step of determining, the method iteratively determines a plurality of trial images each having a respective trial sinogram. The optimized image is one of the plurality of trial images and its corresponding trial sinogram differs from the measured sinogram by less than a predetermined tolerance.