The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Dec. 22, 2015
Applicant:
Rensselaer Polytechnic Institute, Troy, NY (US);
Inventors:
Ge Wang, Loudonville, NY (US);
Yan Xi, Syracuse, NY (US);
Wenxiang Cong, Albany, NY (US);
Zaifeng Shi, Tianjin, CN;
Assignee:
Rensselaer Polytechnic Institute, Troy, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4233 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/4266 (2013.01); A61B 6/4275 (2013.01); A61B 6/4291 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5217 (2013.01); G01T 1/2985 (2013.01);
Abstract
Novel and advantageous methods and systems for performing spectral computed tomography are provided. An edge-on detector, such as a silicon strip detector, can be used to receive X-rays after passing through a sample to be imaged. An energy resolving process can be performed on the collected X-ray radiation. The CT scanner can have third-generation or fourth-generation geometry.