The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Feb. 16, 2016
Stbl Medical Research Ag, Wollerau, CH;
Empa Swiss Federal Laboratories for Materials Science and Technology, Duebendorf, CH;
Mark Melnykowycz, Winterthur, CH;
Frank Clemens, Frauenfeld, CH;
STBL Medical Research AG, Wollerau, CH;
EMPA Swiss Federal Laboratories for Materials Science and Technology, Duebendorf, CH;
Abstract
The method for producing the strain gauge device () comprises a first stop of producing the band (). The band () has flexibility at least in the measuring zone (). Then a sensor () comprising at least one measuring strand () and changing electrical resistivity in dependence of the strain is produced and arranged on or in the band () without pre-tension. Afterwards the shape of the band () is changed into a retaining working shape and thereby the measuring strand () is stretched to an amount of pre-tension.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile