The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Feb. 13, 2016
The Regents of the University of California, Oakland, CA (US);
Zhongping Chen, Irivne, CA (US);
Jiang Zhu, Irvine, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A system for imaging and quantifying shear wave and shear modulus under orthogonal acoustic radiation force (ARF) excitation using the OCT Doppler variance apparatus. The ARF perpendicular or with at least a perpendicular component to the OCT beam is produced by a remote ultrasonic transducer. The OCT Doppler variance apparatus, which is sensitive to the transverse vibration, is used to measure the ARF induced vibration. For analysis of the shear modulus, the Doppler variance apparatus is utilized to visualize shear wave propagation. The propagation velocity of the shear wave is measured and then used to quantitatively map the shear modulus.