The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jun. 23, 2015
Applicant:
Essilor International, Charenton-le-Pont, FR;
Inventors:
Guilhem Escalier, Charenton-le-Pont, FR;
Gildas Marin, Charenton-le-Pont, FR;
Assignee:
Essilor International, Charenton-le-Pont, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01); A61B 3/036 (2006.01); A61B 3/032 (2006.01); G02B 27/22 (2018.01); H04N 13/305 (2018.01);
U.S. Cl.
CPC ...
A61B 3/036 (2013.01); A61B 3/02 (2013.01); A61B 3/022 (2013.01); A61B 3/032 (2013.01); G02B 27/2214 (2013.01); H04N 13/305 (2018.05);
Abstract
Disclosed is an optometry measuring scale and method for determining a visual refraction value of an individual. According to the invention, the optometry measuring scale comprises a plurality of processed optotypes associated with a plurality of visual refraction corrections, wherein each processed optotype results from applying to a source optotype a determined image processing associated with a defined visual refraction correction, and an identification system for determining each defined visual refraction correction associated with each processed optotype.