The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Apr. 18, 2018
Canon Kabushiki Kaisha, Tokyo, JP;
Ruimin Pan, Macquarie Park, AU;
Matthew Raphael Arnison, Umina Beach, AU;
David Robert James Monaghan, Elanora Heights, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
One or more embodiments of an apparatus, system and method of compensating image data for phase fluctuations caused by a wave deforming medium, and storage or recording mediums for use therewith, are provided herein. At least one embodiment of the method comprises capturing, by a sensor of an imaging system, first image data and second image data for each of a plurality of pixel positions of the sensor, the sensor capturing an object through a wave deforming medium causing a defocus disparity between the first image data and second image data; and determining the defocus disparity between the first image data and the second image data, the defocus disparity corresponding to a defocus wavefront deviation of the wave deforming medium. The method may further comprise compensating the image data captured by the sensor for phase fluctuations caused by the wave deforming medium using the determined defocus disparity.