The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10547752 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 28, 2020

Filed:

Oct. 30, 2018
Applicant:

Ricoh Company, Ltd., Ohta-ku, Tokyo, JP;

Inventor:

Takahiro Fukase, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00045 (2013.01); H04N 1/00082 (2013.01); H04N 1/00092 (2013.01);
Abstract

An image inspection device includes a reading device and a processor. The reading device is configured to read a chart image on a recording medium to generate a first read image. The reading device is configured to read an image to be inspected on a recording medium to generate a second read image. The processor is configured to calculate a plurality of types of correction parameters on basis of the first read image and image data of the chart image, correct the image data with the plurality of types of correction parameters to generate a reference image, and compare the reference image and the second read image to inspect the second read image.


Find Patent Forward Citations

Fukase, Takahiro. (2020). Image inspection device, image inspection system, and image inspection method (U.S. Patent No. 10547752). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10547752

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