The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Oct. 26, 2017
Applicant:

Japan Display Inc., Minato-ku, JP;

Inventor:

Norihisa Maeda, Minato-ku, JP;

Assignee:

Japan Display Inc., Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/30 (2006.01); H01L 27/32 (2006.01); H05B 33/10 (2006.01); H01L 51/52 (2006.01); H01L 51/50 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3211 (2013.01); H01L 51/5012 (2013.01); H01L 51/5206 (2013.01); H01L 51/5253 (2013.01); H05B 33/10 (2013.01); H01L 27/3246 (2013.01); H01L 2251/301 (2013.01); H01L 2251/558 (2013.01); H01L 2251/566 (2013.01);
Abstract

A manufacturing method of an organic EL display device including a plurality of subpixels where light emitting layers that emit first to third lights are formed, includes forming a reflective film that reflects light, forming a lower electrode that has conductivity and light transmitting characteristics, a first process where, in the subpixels where the light emitting layers that emit the first and second lights are formed, a part of an optical path length adjusting layer is formed at the same time, a second process where, in the subpixels where the light emitting layers that emit the first and third lights are formed, another part of the optical path length adjusting layer is formed at the same time so as to set its thickness different from that of the one formed in the first process, and forming an upper electrode having conductivity, light transmitting characteristics, and reflective characteristics.


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