The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Nov. 15, 2018
Elwha Llc, Bellevue, WA (US);
Michael H. Baym, Cambridge, MA (US);
Roderick A. Hyde, Redmond, WA (US);
Jordin T. Kare, San Jose, CA (US);
Eric C. Leuthardt, St.Louis, MO (US);
Gary L. McKnight, Bothell, WA (US);
Tony S. Pan, Kirkland, WA (US);
Elizabeth A. Sweeney, Seattle, WA (US);
Clarence T. Tegreene, Mercer Island, WA (US);
Lowell L. Wood, Jr., Bellevue, WA (US);
Elwha LLC, Bellevue, WA (US);
Abstract
Systems and methods are described for modifying a cosmetic product based on a microbe profile including an ingredient-microbe interaction dataset including information associated with interactions between reference cosmetic ingredients and types of reference microbes; and a computing device including circuitry configured to receive information associated with the microbe profile of an individual, receive information associated with an ingredient list of the cosmetic product, compare the microbe profile of the individual and the ingredient list of the cosmetic product to the ingredient-microbe interaction dataset, identify an interaction between at least one cosmetic ingredient in the ingredient list of the cosmetic product and at least one of the one or more types of microbes in the microbe profile of the individual, recommend a modification to the ingredient list in response to an identified interaction, and report to a user the recommended modification.