The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Sep. 10, 2018
Applicant:

Merck Sharp & Dohme Corp., Rahway, NJ (US);

Inventor:

Roberto Irizarry, Wayne, PA (US);

Assignee:

Merck Sharp & Dohme Corp., Rahway, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 7/00 (2006.01); G01N 15/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G01N 15/0205 (2013.01); G06N 20/00 (2019.01);
Abstract

This disclosure relates to a method for estimating a particle size distribution (PSD) and a morphology for a set of particles. A computer system receives a plurality of chord length distributions (CLDs) of different types for a set of particles. The computer system then estimates a morphology for the set of particles based on the plurality of received CLDs. The computer system also identifies a plurality of descriptors of the plurality of CLDs for the set of particles based on the plurality of received CLDs. The computer system then estimates metrics for the PSD for the set of particles based on the plurality of identified CLD descriptors. Based on the estimated PSD metrics for the set of particles, the computer system generates an estimate of the PSD for the set of particles. Finally, the computer system outputs the estimated morphology and the estimated PSD for the set of particles.


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