The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
May. 01, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Hyoa Kang, Seoul, KR;
Changhyun Kim, Seongnam-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/78 (2006.01); G06N 3/08 (2006.01); G08G 1/16 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00805 (2013.01); G06K 9/00201 (2013.01); G06K 9/00798 (2013.01); G06K 9/78 (2013.01); G06N 3/08 (2013.01); G08G 1/167 (2013.01); G06T 2207/30252 (2013.01); G06T 2207/30256 (2013.01); G06T 2207/30261 (2013.01);
Abstract
Disclosed is a method and apparatus for determining an abnormal object, the method including selecting a candidate object from target objects extracted from a two-dimensional (2D) image of a front view captured from a host vehicle, generating a three-dimensional (3D) model of the candidate object, determining, based on the 3D model, whether the candidate object corresponds to an abnormal object that interferes with driving of the host vehicle, and outputting the abnormal object, in response to the candidate object corresponding to the abnormal object.