The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Jun. 30, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Jin Sun, Sammamish, WA (US);

Omid Afnan, Beijing, CN;

Yifung Lin, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2455 (2019.01); G06F 9/48 (2006.01);
U.S. Cl.
CPC ...
G06F 16/24565 (2019.01); G06F 9/4881 (2013.01);
Abstract

Reducing data skew when performing computational jobs (such as responding to complex queries or queries on big data sets). To gather performance information for a vertex in a distributed stage, the distributed stage is processed and the resulting performance information being generated. The system then identifies a performance outlier of the vertices, which varies from a performance norm of other vertices. A trigger instruction is then generated that is structured to trigger the performance outlier vertex to gather data distribution information of the data that the performance outlier vertex previously processed. The trigger instruction may thus be executed to cause the performance outlier vertex to gather the data distribution information for evaluation for data skew.


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