The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Aug. 22, 2016
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Aman Chandra, Bangalore, IN;

Varun Anant, Bangalore, IN;

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/33 (2019.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3672 (2013.01); G06F 16/3344 (2019.01); G06F 17/2725 (2013.01); G06F 11/36 (2013.01); G06F 17/277 (2013.01);
Abstract

The present disclosure is related in general to software testing and a method and a system for automatically identifying violation in the test cases. A test case validation system categorizes the test cases into event-based test cases and binary test cases. Further, a Part-Of-Speech (POS) pattern is detected in the one or more test cases based on POS tags assigned to each of the tokens in test cases. Thereafter, comparison of the detected POS pattern and the one or more tokens with predefined POS patterns and predefined tokens identifies violations in the one or more test cases if any, using pattern matching and Natural Language Processing (NLP). The predefined POS patterns and tokens used for comparison are filtered based on category of the test case thus accelerating the process of the violation identification. The test case validation system is capable of accurately identifying more than one type of violations simultaneously.


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