The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Oct. 18, 2018
Applicant:

Denso International America, Inc., Southfield, MI (US);

Inventors:

Gopalakrishnan Iyer, Santa Clara, CA (US);

Ameer Kashani, Southfield, MI (US);

Assignee:

Denso International America, Inc., Southfield, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3612 (2013.01); G06F 11/0766 (2013.01); G06F 11/302 (2013.01); G06F 11/3055 (2013.01); G06F 11/3616 (2013.01); G06F 11/3644 (2013.01);
Abstract

System, methods, and other embodiments described herein relate to improving detection of program faults. In one embodiment, a method includes executing, in parallel, an extended program and an instrumented program. The instrumented program is an instrumented version of a baseline program that implements runtime checks. The extended program is an extended version of the baseline program with intentional delays inserted into source code of the baseline program to match an execution time with the instrumented program. The method includes supervising execution states of the instrumented program to identify an occurrence of mismatched states between the extended program and the instrumented program. The method includes managing the mismatched states to mitigate effects of the program faults on the functioning of an associated device.


Find Patent Forward Citations

Iyer, Gopalakrishnan. (2020). System and methods for parallel execution and comparison of related processes for fault protection (U.S. Patent No. 10545850). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10545850

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…