The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Nov. 06, 2018
Applicant:

Usnr, Llc, Woodland, WA (US);

Inventors:

Douglas G. Strasky, Parksville, CA;

Erik W. Kalf, Errington, CA;

Brian Walts, Nanaimo, CA;

Assignee:

USNR, LLC, Woodland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 2009/45583 (2013.01); G06F 2009/45591 (2013.01);
Abstract

The present disclosure describes methods and systems for virtually calibrating geometric sensors with overlapping fields of view. In some embodiments, a geometric sensor may be virtually calibrated by applying a correction value to profile data obtained by the geometric sensor to generate adjusted profile data. The correction factor may be determined based at least in part on X-Y offsets and/or rotational offsets of prior profile data obtained by the geometric sensor relative to corresponding profile data obtained by a reference geometric sensor, and may be recalculated or updated as new sets of profile data are obtained. The adjusted profile data may be used in place of the original profile data in various data processing operations to functionally offset a positional error of the geometric sensor.


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