The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Dec. 18, 2018
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Ondrej Mandula, Grenoble, FR;

Cedric Allier, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/06 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01N 21/6458 (2013.01); G01N 21/6486 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G06K 9/00127 (2013.01);
Abstract

The invention relates to a method for observing a fluorescent sample lying in a sample plane, where the sample comprises a fluorescent agent able to emit a fluorescence light wave in a fluorescence spectral band when it is illuminated by an excitation light wave, in an excitation spectral band. The method includes illuminating the sample using a first light source, in a first illumination spectral band in the excitation spectral band, and acquiring a first image of the sample, in the fluorescence spectral band, using an image sensor; and illuminating the sample using a second light source, in a second spectral band, outside of the fluorescence spectral band, and acquiring a second image of the sample, in the second spectral band, using the image sensor. The image sensor is coupled to an optical system such that in the fluorescence spectral band, the object focal plane of the optical system is coincident with the plane of the sample; and in the second spectral band, the object focal plane of the optical system is offset with respect to the plane of the sample.


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