The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Aug. 23, 2016
Applicant:

Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Manfred Kuster, Widnau, CH;

Michael Guentert, Heerbrugg, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/13 (2006.01); G02B 21/00 (2006.01); G02B 21/08 (2006.01); G02B 21/22 (2006.01);
U.S. Cl.
CPC ...
G02B 21/22 (2013.01); A61B 3/132 (2013.01); G02B 21/0012 (2013.01); G02B 21/082 (2013.01);
Abstract

An illumination and observation system () for an ophthalmic surgical microscope () has first, second, third and fourth observation pupils () for two observers, a coaxial illumination () in the first, third and fourth observation pupils to generate a red reflex () therein, and a main illumination () in the second observation pupil. For widely illuminating the surroundings, the main illumination has a larger illumination field than the coaxial illumination in any of the first, third and fourth observation pupils. For superior observation quality and a visible and homogenous red reflex in the second observation pupil, the main illumination overlaps at least 50% with the second observation pupil. The main illumination may be aligned within ±5° to an optical axis () of the second observation pupil and to overlap the coaxial illumination at least 50% with the first, third and fourth observation pupils.


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