The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Sep. 05, 2018
National University Corporation Nagoya Institute of Technology, Nagoya-shi, Aichi, JP;
Olympus Corporation, Tokyo, JP;
Masaki Tanemura, Owariasahi, JP;
Riteshkumar Ratneshkumar Vishwakarma, Nagoya, JP;
Mohamad Saufi Bin Rosmi, Nagoya, JP;
Yazid Bin Yaakob, Nagoya, JP;
Yuji Wakamatsu, Nagoya, JP;
Masashi Kitazawa, Ina, JP;
National University Corporation Nagoya Institute of Technology, Nagoya-shi, Aichi, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A cantilever used in a scanning probe microscope includes a supporting section, a lever section, and a protrusion section, which is a probe. A crystalline carbon composite layer including a crystalline carbon nanomaterial and a metal material, a melting point of which is 420° C. or lower, is deposited on a distal end portion of the protrusion section.