The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Jul. 15, 2016
Applicants:
Universität Basel, Basel, CH;
Eth Zurich, Zurich, CH;
Inventors:
David Martinez-Martin, Basel, CH;
Daniel J. Mueller, Basel, CH;
Sascha Martin, Basel, CH;
David Alsteens, Allschwil, CH;
Gotthold Flaschner, Freiburg, DE;
Assignees:
ETH ZURICH, Zurich, CH;
UNIVERSITÄT BASEL, Basel, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/14 (2010.01); C12M 1/00 (2006.01); G01Q 60/38 (2010.01); G01Q 70/02 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/14 (2013.01); C12M 23/38 (2013.01); C12M 41/14 (2013.01); G01Q 60/38 (2013.01); G01Q 70/02 (2013.01);
Abstract
The invention relates to a top-cover for a controlled environmental system (CES) for use with a measurement technique that requires introducing a probe to a sample placed on a sample holder, a CES and a procedure to control the environment for a sample in a system in particular a CES during a measurement with a probe based technique.