The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Jan. 07, 2015
Applicant:

Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;

Inventor:

Tetsuya Noda, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 21/648 (2013.01); G01N 21/6486 (2013.01); G01N 2021/6417 (2013.01); G01N 2201/068 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An immunoassay method in which, by using a sensor chip on which a plurality of capture regions which capture a material to be detected by a first capturing body are arranged separated from each other, the material to be detected captured by the first capturing body is individually detected, wherein the plurality of capture regions are formed by using a different type of first capturing body depending on the type of a material to be detected to be captured, the method having: a detection processing order determination step of determining a detection processing order between the capture regions based on information about a detection processing order between the plurality of the capture regions; and a detection processing step of performing a detection processing for each of the capture regions according to the detection processing order between the plurality of the capture regions, and an immunoassay system using the method.


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