The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Apr. 26, 2016
Vayyar Imaging Ltd, Yehud, IL;
Yuval Lomnitz, Herzlia, IL;
Jonathan Rosenfeld, Ramat hasharon, IL;
Doron Cohen, Tel-Aviv, IL;
Shachar Shayovitz, Ness Ziona, IL;
VAYYAR IMAGING LTD, Yehud, IL;
Abstract
Systems, device and methods are provided for measuring parameters of a medium such as the dielectric properties of a medium including a plurality of layers, using an array of sensors. The array comprises at least two transducers and at least one transceiver attached to said at least two transducers, the at least one transceiver is configured to transmit at least one signal toward the medium and receive a plurality of signals affected by the medium; a data acquisition unit and at least one processor unit, configured to: process the affected plurality of signals to yield a plurality of transfer functions wherein each of said plurality of transfer functions comprising said medium response between two transducers of said at least two transducers as function of frequency or time; and process the plurality of transfer functions to yield a plurality of statistical measures, and process said statistical measures to calculate said medium parameters.