The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Nov. 15, 2017
Applicant:

William Albert Johnston, Houston, TX (US);

Inventor:

William Albert Johnston, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); E21B 47/12 (2012.01); G01H 9/00 (2006.01); G01V 1/52 (2006.01); G01V 8/14 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35361 (2013.01); E21B 47/123 (2013.01); G01H 9/006 (2013.01); G01V 1/52 (2013.01); G01V 8/14 (2013.01);
Abstract

An embodiment of a system for measuring a parameter includes at least a first optical fiber and a second optical fiber configured to be disposed in one or more boreholes in an earth formation, the first optical fiber and the second optical fiber including a plurality of sensing locations. The system also includes a first light source configured to launch a first optical signal into at least the first optical fiber, and a second light source configured to launch a second optical signal into at least the second optical fiber, wherein the first optical signal and the second optical signal are launched at least substantially simultaneously. The system further includes a processor configured to receive measurement data generated based on backscattered signals from at least the first optical fiber and the second optical fiber the reflected signals, the processor configured estimate the parameter based on the measurement data.


Find Patent Forward Citations

Johnston, William. (2020). Distributed parameter measurements using multiple optical sources (U.S. Patent No. 10545036). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10545036

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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