The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Apr. 14, 2015
Hexagon Metrology, Inc., North Kingstown, RI (US);
Paul Racine, Providence, RI (US);
Scott Carlson, North Kingstown, RI (US);
Hexagon Metrology, Inc., North Kingstown, RI (US);
Abstract
A method and apparatus for measuring an object using a CMM receives nominal geometry data relating to the object, and produces a set-up path based on the received nominal geometry data. The method also conducts a set-up measurement of the object using a CMM probe. The CMM probe conducts the set-up measurement by following the set-up path, and the set-up measurement of the object produces scan path information. The method generates a scan path using the scan path information, and controls the CMM probe to conduct a fine measurement of the object by causing the CMM probe to move along the generated scan path.