The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Jul. 31, 2017
Applicant:

Phc Holdings Corporation, Tokyo, JP;

Inventors:

Hiroshi Saiki, Ehime, JP;

Kouzou Tagashira, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/15 (2006.01); G01N 21/07 (2006.01); B01L 3/00 (2006.01); A61B 5/145 (2006.01); A61B 5/1455 (2006.01); A61B 5/157 (2006.01); G01N 33/02 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/157 (2013.01); A61B 5/150022 (2013.01); A61B 5/150061 (2013.01); A61B 5/150213 (2013.01); A61B 5/150251 (2013.01); A61B 5/150343 (2013.01); A61B 5/150358 (2013.01); A61B 5/150755 (2013.01); B01L 3/5021 (2013.01); B01L 3/50273 (2013.01); B01L 3/502715 (2013.01); B01L 3/502738 (2013.01); G01N 21/07 (2013.01); G01N 33/02 (2013.01); B01L 2200/027 (2013.01); B01L 2200/06 (2013.01); B01L 2200/0605 (2013.01); B01L 2200/0621 (2013.01); B01L 2300/046 (2013.01); B01L 2300/047 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0803 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0825 (2013.01); B01L 2300/0883 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/0409 (2013.01); B01L 2400/0688 (2013.01); G01N 2035/00237 (2013.01); G01N 2035/0449 (2013.01); Y10T 436/111666 (2015.01);
Abstract

An analyzing device having a microchannel structure includes a sample inlet and a guide section extending from the sample inlet toward an axial center. The analyzing device further includes a first cavity connected to the guide section and configured to measure a certain amount of a sample liquid, and a receiving cavity located adjacent to the first cavity and receiving the sample liquid. The analyzing device further includes a liquid reservoir formed between the sample inlet and the guide section and temporarily holds the sample liquid before being suctioned into the guide section. The sample liquid temporarily held in the liquid reservoir is transferred from the liquid reservoir to the guide section and the first cavity by a capillary force and transferred to the receiving cavity by a centrifugal force caused by rotating the analyzing device about the axial center.


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