The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2020
Filed:
Nov. 17, 2016
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
Yasutaka Konno, Tokyo, JP;
Fumito Watanabe, Tokyo, JP;
Isao Takahashi, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention is directed to make a photon-counting CT apparatus capable of more accurate data acquisition. Such apparatus is provided with a reference detection unit and a time measuring instrument to measure temporal fluctuations in a rotational direction of an X-ray irradiation unit. The apparatus corrects temporal fluctuations in the rotational direction involved in data measured by the reference detection unit, using time measurement data which is output by the time measuring instrument. Using corrected measurement data measured by the reference detection unit, the apparatus makes corrections of fluctuations pertaining to the X-ray tube of the X-ray irradiation unit and pile-up. Data corrections with high accuracy are thus enabled.