The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Dec. 12, 2017
Applicant:

Eastman Kodak Company, Rochester, NY (US);

Inventors:

Carolyn Rae Ellinger, Rochester, NY (US);

William Yurich Fowlkes, Pittsford, NY (US);

Kevin Edward Spaulding, Spencerport, NY (US);

Assignee:

EASTMAN KODAK COMPANY, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 (2006.01); H05K 1/02 (2006.01); H01L 23/544 (2006.01); H01G 4/002 (2006.01); H01C 1/04 (2006.01); H01G 4/33 (2006.01); H01C 7/00 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0269 (2013.01); H01C 1/04 (2013.01); H01G 4/002 (2013.01); H01L 23/544 (2013.01); H01C 7/006 (2013.01); H01G 4/33 (2013.01); H01L 2223/5442 (2013.01); H01L 2223/54433 (2013.01); H05K 1/0274 (2013.01); H05K 2201/09936 (2013.01); H05K 2201/2054 (2013.01);
Abstract

An electrical element includes an optically-detectable pattern of embedded information. A plurality of thin-film layers is applied on the surface of the substrate wherein one or more of the thin-film layers is at least partially transparent. The plurality of thin-film layers overlaps in an encoding region to form an optical layer structure, wherein at least one of the thin-film layers in the optical layer structure contributes to an electrical function of the electrical element. At least one of the thin-film layers in the optical layer structure includes an information-encoding pattern which contributes to an optically-detectable interference image when illuminated by incident light, and wherein the optically-detectable interference image corresponds to at least a portion of the pattern of embedded information.


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