The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Apr. 05, 2019
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Yejee Lee, Seoul, KR;

Hongsuk Kim, Seoul, KR;

Youngdae Lee, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04W 24/00 (2009.01); H04W 24/10 (2009.01); H04B 17/327 (2015.01); H04W 88/02 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/327 (2015.01); H04W 88/02 (2013.01);
Abstract

Provided are a method of measurement reporting and a device supporting the method. According to one embodiment of the present invention, the method includes: receiving a configuration of condition for measurement report; starting a first timer related to a first cell, when a report triggering event for the first cell is occurred; detecting a triggering event for a second cell and that the condition is satisfied; and reporting measurement results of the first cell and the second cell, when the first timer is expired or stopped.


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