The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Dec. 21, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Rui Chen, Bellevue, WA (US);
Geoffrey Ryan Dworkin, Tucson, AZ (US);
Douglas R. Hains, Seattle, WA (US);
Brent Russell Smith, Redmond, WA (US);
Serguei B. Stepaniants, Redmond, WA (US);
Sen Zhao, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Described herein is a system and method for processing analytics data in a windowed manner. In some embodiments, each user of a number of users is assigned to a group (e.g., a treatment group or a control group). The system may monitor each user to obtain metric data associated with each of the users over the course of an experiment. In some embodiments, the system may identify an indication of a trigger event with respect to each user. For example, the indication of the trigger event may comprise a time at which an event occurred for that user. The system may identify and compile data from the metric data for each of the users with respect to the trigger event. In some embodiments the metric data may be aggregated for each of the users with respect to a window or timespan positioned relative to the identified trigger event.