The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Mar. 29, 2019
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Sergey Parshin, Redcliffe, AU;

Jon R. Ducrou, West End, AU;

Ryan David Hapgood, Belmont, AU;

Jeanette Rogers, Mount Gravatt East, AU;

Uladzimir Silchanka, Boondall, AU;

Muthu Pandian Shanmugarajan, Greenslopes, AU;

Matthew Lake, The Gap, AU;

Bradley Nathaniel Gray, Auchenflower, AU;

Yeyang Yu, Logan Central, AU;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01); G06K 7/10 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/391 (2015.01); G06K 7/0095 (2013.01); G06K 7/10019 (2013.01);
Abstract

A system that performs self-diagnosing of unreliable radio frequency identification (RFID) tags in a first location within an environment includes an RFID printer that prints RFID tags in the first location and RFID antennas located at different distances to the first location. The system obtains, for each RFID tag, a first set of RFID parameters of the RFID tag for each RFID antenna when the RFID tag is in the first location. The system generates, for each RFID tag, a model of RFID tag behavior over different distances to an RFID antenna, based at least in part on the first set of RFID parameters obtained for the RFID tag.


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