The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Dec. 19, 2018
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Hiroyuki Miura, Kyoto, JP;

Hideaki Izumi, Kyoto, JP;

Kiyoshi Ogawa, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/22 (2006.01); H01J 49/40 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/408 (2013.01); H01J 49/022 (2013.01); H01J 49/025 (2013.01);
Abstract

A microchannel plate (MCP)in an ion detection sectionmultiplies electrons. An anodedetects those electrons and produces a current signal. An amplifierconverts this signal into a voltage signal. A low-pass filterA acting as a smoothing sectionis located at the output end of the amplifier. A waveform-shaping time adjusteradjusts the time constant of the low-pass filterA beforehand according to the response time of the MCP, mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved.


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