The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Feb. 20, 2018
Beijing Jingdong Shangke Information Technology Co., Ltd., Beijing, CN;
Jd.com American Technologies Corporation, Santa Clara, CA (US);
Beijing Jingdong Shangke Information Technology Co., Ltd., Beijing, CN;
JD.com American Technologies Corporation, Santa Clara, CA (US);
Abstract
Embodiments of the present disclosure disclose a method and an apparatus for determining a planar surface. A specific embodiment of the method comprises: determining, from obtained images of the environment that include a to-be-determined planar surface, feature points belonging to the to-be-determined planar surface; judging whether the number of the feature points belonging to the to-be-determined planar surface is smaller than a preset number threshold; if yes, generating first prompt information for prompting a user to add feature points on the to-be-determined planar surface; obtaining at least two first images including the added feature points; and in response to the number of the feature points belonging to the to-be-determined planar surface in the first images being no less than the preset number threshold, reconstructing the to-be-determined planar surface based on the first images so as to determine a location and an orientation of the to-be-determined planar surface. This embodiment implements reconstruction of a weakly-textured or texture-less planar surface.