The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Jun. 14, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Steven Richard Irrgang, North Ryde, AU;

Thai Quan Huynh-Thu, Edgecliff, AU;

Juno Kim, Bexley, AU;

Vanessa Jeanie Honson, Karela, AU;

Matthew Raphael Arnison, Umina Beach, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/50 (2011.01); G06T 15/04 (2011.01);
U.S. Cl.
CPC ...
G06T 15/50 (2013.01); G06T 15/04 (2013.01);
Abstract

A method of rendering a graphical object comprises accessing a mapping relating a mesoscale structure and a light scattering parameter of a material to a perceptual appearance characteristic; determining a perceptual appearance characteristic of the graphical object, the graphical object reproduced on an interface to represent an object formed from the material, the perceptual appearance characteristic determined in accordance with the mapping using an initial mesoscale structure and a light scattering parameter of the material; receiving a signal indicating a modification in structure relating to the initial mesoscale structure; and determining, using the mapping, an adjustment of the light scattering parameter preserving the determined perceptual appearance characteristic, based on the modification of the initial mesoscale structure. The method further comprises adjusting the light scattering parameter of the material according to the adjustment; and rendering the graphical object using the modified mesoscale structure and the adjusted light scattering parameter.


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