The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Oct. 17, 2011
Applicants:

Omer Barkol, Haifa, IL;

Shahar Golan, Haifa, IL;

Ruth Bergman, Haifa, IL;

Yifat Felder, Yehud, IL;

Arik Sityon, Ganne Tiqwa, IL;

Mohammed J. Zaki, Troy, NY (US);

Pranay Anchuri, Troy, NY (US);

Inventors:

Omer Barkol, Haifa, IL;

Shahar Golan, Haifa, IL;

Ruth Bergman, Haifa, IL;

Yifat Felder, Yehud, IL;

Arik Sityon, Ganne Tiqwa, IL;

Mohammed J. Zaki, Troy, NY (US);

Pranay Anchuri, Troy, NY (US);

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24544 (2019.01);
Abstract

A method for discovering representative composite configuration item (CI) patterns in an IT system that includes a plurality of configuration items may include data mining a graph representing the IT system to extract extended frequent composite CI patterns. The method may also include clustering the extended frequent composite CI patterns into clusters based on similarity between the maximal frequent composite CI patterns. The method may further include extracting a representative composite CI pattern for each of the clusters, and using an output device, outputting the representative composite CI pattern for each of the clusters.


Find Patent Forward Citations

Loading…