The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Jun. 15, 2012
Applicants:

Tyler Junichi Petri, Seattle, WA (US);

Daniel J. Fogarty, Mukilteo, WA (US);

David Harding Jones, Bellevue, WA (US);

Allison Moran, Batavia, IL (US);

Kevin Nicholas King, Mill Creek, WA (US);

Inventors:

Tyler Junichi Petri, Seattle, WA (US);

Daniel J. Fogarty, Mukilteo, WA (US);

David Harding Jones, Bellevue, WA (US);

Allison Moran, Batavia, IL (US);

Kevin Nicholas King, Mill Creek, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0262 (2013.01);
Abstract

A system is provided for integrating failure data for different failure analysis layouts. The system includes a data validator and layout engine. The data validator is configured to validate failure analysis data for a complex system including a plurality of systems. The failure analysis data includes failure data identifying failed systems, and design data describing the complex system and possible failures of at least some of its systems. In this regard, the data validator is configured to perform one or more consistency checks between the failure data and design data to thereby integrate the failure data for a plurality of different failure analysis layouts. The layout engine is in turn configured to selectively generate and communicate any one or more of the plurality of different layouts of the failure analysis data, with at least some of the failure analysis data being shared between at least some of the different layouts.


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