The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Apr. 24, 2018
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Yoshiyuki Taki, Utsunomiya, JP;
Noa Sumida, Narashino, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01); B41J 2/37 (2006.01); G03G 15/04 (2006.01); G03G 15/043 (2006.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
G03G 15/04072 (2013.01); B41J 2/471 (2013.01); G03G 15/043 (2013.01);
Abstract
An optical scanning apparatus includes a deflector configured to deflect a light beam from a light source and scan a surface to be scanned in a main-scanning direction and a single imaging optical element configured to guide the light beam deflected by the deflector to the surface to be scanned. Scanning speeds of the light beam on the surface to be scanned at an on-axis image height and at an off-axis image height are different from each other, and conditions0.0<(12)/(12)<1.7 and0.8<are satisfied.