The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Mar. 12, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Masayasu Teramura, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/04 (2006.01); G02B 26/12 (2006.01);
U.S. Cl.
CPC ...
G03G 15/04036 (2013.01); G02B 26/123 (2013.01);
Abstract

Light scanning apparatus includes a first imaging optical system including one or more imaging optical elements (IOEs) and a first reflective element on optical path between deflecting unit and a first one of IOEs having greatest power in sub-scanning section, and a second imaging optical system including one or more IOEs and a second reflective element on optical path between second scanned surface and a second one of IOEs having greatest power in sub-scanning section. A straight line passing through first and second light-condensing positions of first and second light fluxes deflected by deflecting unit on first and second optical axes is not perpendicular to sub-scanning direction. Distances on first and second optical axes from first and second axial deflecting points to first and second IOEs, and distances on first and second optical axes from first and second axial deflecting points to first and second scanned surfaces are appropriately set.


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