The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Jul. 10, 2017
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Kanako Kondo, Tokyo, JP;
Nobuhiro Takamizawa, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is a microscope system including: a plurality of objective lenses that are selectively used to collect fluorescence from a specimen; a detecting unit that obtains image information of the specimen on the basis of the fluorescence collected by the objective lens; and an adjustment unit that adjusts the observation range of the specimen S and that divides the observation range into one or more observation regions corresponding to a capture range captured by the detecting unit, wherein the adjustment unit calculates an observation magnification at which the entire well is included in the observation range, the number of observation regions is minimized, and the resolution becomes the highest, on the basis of information about the size of the well in a multi-plate for accommodating the specimen and information about an objective magnification of the objective lens, and adjusts the observation range on the basis of the calculated observation magnification.