The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Jun. 21, 2017
Tsinghua University, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
An imaging system is provided, which includes: a microscope; a field diaphragm; a one-dimensional beam-splitting grating, configured to duplicate a beam after passing through the first 4f system into beams with different angles; a phase modulation component, configured to perform different phase modulations to the beams with different angles respectively; a blazed grating, configured to perform dispersion to the beams with different angles passing through the phase modulation component at a dimension orthogonal to the beam-splitting grating; a micro lens array, configured to make the beams with different angles passing through the blazed grating to map to different locations on a back focal plane of the micro lens array; an image sensor, configured to image the back focal plane of the micro lens array. The system may recover three-dimensional information and multispectral information of the sample simultaneously from a single image.