The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Jun. 29, 2015
Applicant:
Phc Holdings Corporation, Tokyo, JP;
Inventors:
Masayuki Saiki, Ehime, JP;
Masahiro Johno, Ehime, JP;
Fusatoshi Okamoto, Ehime, JP;
Kazuya Kondoh, Ehime, JP;
Assignee:
PHC HOLDINGS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01N 33/543 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54366 (2013.01); B01L 3/502 (2013.01); G01N 33/54326 (2013.01); B01L 2300/0627 (2013.01); B01L 2400/0409 (2013.01);
Abstract
A substrate for sample analysis is a substrate for sample analysis used for causing a binding reaction between an analyte and a ligand in a liquid sample, the substrate for sample analysis including: a base substrate having a rotation axis and a predetermined thickness; a chamber located in the base substrate for holding a liquid sample containing an analyte and a ligand immobilized on a surface of magnetic particles; and at least one magnet arranged at a position such that the magnetic particles are captured in the chamber by the magnet.