The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
May. 15, 2017
Weatherford Technology Holdings, Llc, Houston, TX (US);
Robert P. Badrak, Sugar Land, TX (US);
Sergey Kolesov, St. Petersburg, RU;
Weatherford Technology Holdings, LLC, Houston, TX (US);
Abstract
Using an X-ray diffractometer, a processing device, and memory, a database models estimates of a number of cycles to failure for each of a plurality of materials. The model estimates are performed on the material at a plurality of applied fatigues up to a failure point and are based on parameters including residual stress, the micro-strain, and the ratio between X-Ray peak intensity and background intensity of the component material. To inspect a component, the material of the component is selected in the database, and measurements are obtained at two or more different depths of at least a portion of the component. Information about current residual stress, micro-strain, and ratio between X-Ray peak intensity and background intensity are determined from the obtained measurements. Then, a fatigue life of the portion of the component is estimated by matching the information to at least one of the modelled estimates of the number of cycles to failure in the database for the selected material.