The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Dec. 21, 2018
Applicant:

Shenzhen Dikai Industrial Co., Ltd., Shenzhen, CN;

Inventors:

Xiuling Zhu, Shenzhen, CN;

Gary Bruce Peckham, Shenzhen, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/87 (2006.01); G01N 21/63 (2006.01); G01N 25/18 (2006.01); G01N 27/04 (2006.01); G01N 21/88 (2006.01); G01N 33/38 (2006.01); G01N 21/25 (2006.01); G01N 21/33 (2006.01); G01N 21/35 (2014.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/87 (2013.01); G01N 21/25 (2013.01); G01N 21/33 (2013.01); G01N 21/35 (2013.01); G01N 21/63 (2013.01); G01N 21/8803 (2013.01); G01N 25/18 (2013.01); G01N 27/02 (2013.01); G01N 27/041 (2013.01); G01N 33/381 (2013.01);
Abstract

A multi-functional precious stone testing apparatus includes a portable housing, a testing unit, and an indication unit. The portable housing includes a hand-held casing and a probe casing extended from a front end of the hand-held casing. The testing unit includes a conductive probe having a testing end portion extended out of a tip end of the probe casing for contacting a testing object to determine a conductivity of the testing object. The indication unit includes a LED light unit received in the hand-held casing for illuminating the testing end portion of the conductive probe during testing, wherein the LED light unit is positioned away from the tip end of the probe casing for preventing heat generated from the LED light unit being transmitted toward the conductive probe to affect an accurate measurement for the conductivity of the testing object.


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