The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Oct. 23, 2017
Tsinghua University, Beijing, CN;
Qionghai Dai, Beijing, CN;
Ziwei Li, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
A microscopy imaging system is disclosed. The system includes: a femtosecond laser; an acousto-optic modulator, configured to periodically modulate an intensity of a laser light; a line-scanning component, configured to focus the laser light to form a line-shaped beam and to scan in a direction perpendicular to the line-shaped beam; a chromatic dispersion component, configured to generate spatial chirped laser pulses; a collimating lens, configured to converge components with different wavelengths dispersed by the chromatic dispersion component to propagate in parallel; a microscope component, configured to guide light passing through the collimating lens to illuminate the sample and capture a fluorescence image at a focal plane; and a synchronous control component, configured to synchronously control the acousto-optic modulator to modulate the intensity of the laser light, the line-scanning component to scan and the microscope component to capture fluorescence images, such that a reconstructed image is obtained according to the images.