The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Feb. 17, 2016
Nec Corporation, Tokyo, JP;
Takehiko Mizoguchi, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A system monitoring apparatus has: a determination unit for determining whether the relatedness indicating a relationship that is true for first time-series data of multiple sets measured during a first time period is true for second time-series data of the multiple sets measured during a second time period; an irregularity degree calculation unit for calculating the degree of irregularity indicating the extent to which the second time-series data is irregular; a first extent calculation unit for calculating a first extent indicating the extent to which the irregularity is at a specified value when the second time-series data are normal or irregular; a second extent calculation unit for calculating a second extent indicating the extent to which the second time-series data of the multiple sets are related; and a state calculation unit for finding whether the second time-series data are normal or irregular, based on the first and second extents.