The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Sep. 22, 2017
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Florian Dotschkal, Aalen, DE;
Günter Haas, Aalen, DE;
Josef Wanner, Oberkochen, DE;
Florian Mayer, Backnang, DE;
Tobias Schramm, Eschach, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A computer-assisted method for determining dimensional properties of a measurement object using a coordinate measuring machine. An image representation of the measurement object is shown to a user and the user selects a first geometric element of the measurement object, resulting in the display of eligible test features for the selected first geometric element. The eligible test features are automatically determined from a plurality of typical test features stored in a database, by the selected first geometric element being assigned to one of a plurality of predefined measurement elements stored in the database. A defined measurement sequence is generated in a computer-assisted manner based on the test feature selected by the user. Individual measured values are recorded on the first geometric element using the defined measurement sequence. A numerical value based on the individual measured values is determined, which represents a dimensional property of the first geometric element corresponding to the selected test feature.