The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Jan. 28, 2015
Applicant:
Qiagen Gmbh, Hilden, DE;
Inventors:
Daniel Müller, Hilden, DE;
Sascha Strauss, Solingen, DE;
Assignee:
QIAGEN GMBH, Hilden, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6881 (2018.01); C12Q 1/686 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6881 (2013.01); C12Q 1/686 (2013.01); C12Q 2600/156 (2013.01); C12Q 2600/16 (2013.01); C12Q 2600/172 (2013.01);
Abstract
Short tandem repeat (STR) markers are genetic elements that are frequently used in the fields of forensic analysis, paternity determination and detection of genetic diseases and cancers. Such analysis involves the amplification of STR loci. Technically, this can be challenging due to sequence variations in the flanking regions of the locus. In the case of SE33, previous amplification efforts have failed. The present invention describes a set of primers for the amplification of SE33 and a method for the analysis of the presence and/or level of SE33, also in combination with other STRs.